The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Jan. 25, 2021
Applicant:

Mellanox Technologies, Ltd., Yokneam, IL;

Inventors:

Tali Septon, Haifa, IL;

Itshak Kalifa, Bat-Yam, IL;

Elad Mentovich, Tel Aviv, IL;

Matan Galanty, Korzim, IL;

Yaakov Gridish, Yoqneam Ilit, IL;

Hanan Shumacher, Kohav Yair, IL;

Vadim Balakhovski, Herzliya, IL;

Juan Jose Vegas Olmos, Solrød Strand, DK;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01S 5/183 (2006.01); H01S 5/00 (2006.01); H01S 5/026 (2006.01); H01S 5/42 (2006.01);
U.S. Cl.
CPC ...
H01S 5/423 (2013.01); H01S 5/0014 (2013.01); H01S 5/0042 (2013.01); H01S 5/0261 (2013.01); H01S 5/18302 (2013.01);
Abstract

A method and system for large scale Vertical-Cavity Surface-Emitting Laser (VCSEL) binning from wafers to be compatible with a Clock-Data Recovery Unit (CDRU) and/or a VCSEL driver are provided. An illustrative method of binning is provided that includes: for at least a portion of VCSELs on a wafer, measuring a set of representative parameters of the VCSELs, of predetermined DC or small-signal values, and sorting the measured VCSELs into clusters according to the measured set of representative parameters of the VCSELs; further sorting the clusters into sub-groups that comply with specifications of the VCSEL driver; and providing a feedback signal to the CDRU for equalizing control signals provided to the VCSEL driver.


Find Patent Forward Citations

Loading…