The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Dec. 29, 2022
Sony Corporation, Tokyo, JP;
Seiichiro Tabata, Tokyo, JP;
Shinichiro Yamada, Tokyo, JP;
Masayoshi Kanno, Tokyo, JP;
Tsutomu Noguchi, Tokyo, JP;
Takeshi Horie, Tokyo, JP;
Sony Corporation, Tokyo, JP;
Abstract
A sheet-shaped member is provided and includes a porous carbon material including a material obtained from carbonization of a raw material including rice husk, the raw material having a silicon content of at least 5 wt %, the raw material is heat treated before carbonization, and the raw material is treated by an alkali treatment after carbonization to reduce the silicon content, the porous carbon material having a specific surface area of at least 10 m2/g as measured by the nitrogen BET method, a pore volume of at least 0.1 cm3/g as measured by the BJH method and MP method, and an R value of 1.5 or greater, wherein the porous carbon material includes mesopores having pore sizes from 2 nm to 50 nm and obtained from the alkali treatment of the raw material after carbonization, the porous carbon material further includes macropores and micropores, the R value is expressed as R=B/A, the A referring to an intensity at an intersection between the baseline of a diffraction peak of the (002) plane as obtained based on powdery X-ray diffractometry of the porous carbon material and a perpendicular line downwardly drawn from the diffraction peak of the (002) plane, and the B referring to the intensity of the diffraction peak of the (002) plane.