The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Jun. 30, 2016
Emerald Cloud Lab, Inc., South San Francisco, CA (US);
Alex M. Yoshikawa, South San Francisco, CA (US);
Anand V. Sastry, South San Francisco, CA (US);
Asuka Ota, South San Francisco, CA (US);
Ben C. Kline, South San Francisco, CA (US);
Bradley M. Bond, South San Francisco, CA (US);
Brian M. Frezza, Redwood City, CA (US);
Cameron R. Lamoureux, South San Francisco, CA (US);
Catherine L. Hofler, South San Francisco, CA (US);
Cheri Y. Li, South San Francisco, CA (US);
Courtney E. Webster, South San Francisco, CA (US);
Daniel J. Kleinbaum, Redwood City, CA (US);
George N. Stanley, South San Francisco, CA (US);
George W. Fraser, Mountain View, CA (US);
Guillaume Robichaud, South San Francisco, CA (US);
Hayley E. Buchman, South San Francisco, CA (US);
James R. McKernan, South San Francisco, CA (US);
Jonathan K. Leung, Sunnyvale, CA (US);
Paul R. Zurek, South San Francisco, CA (US);
Robert M. Teed, South San Francisco, CA (US);
Ruben E. Valas, South San Francisco, CA (US);
Sean M. Fitzgerald, South San Francisco, CA (US);
Sergio I. Villarreal, South San Francisco, CA (US);
Shayna L. Hilburg, South San Francisco, CA (US);
Shivani S. Baisiwala, South San Francisco, CA (US);
Srikant Vaithilingam, South San Francisco, CA (US);
Wyatt J. Woodson, South San Francisco, CA (US);
Yang Choo, South San Francisco, CA (US);
Yidan Y. Cong, South San Francisco, CA (US);
Emerald Cloud Lab, Inc., South San Francisco, CA (US);
Abstract
The disclosure provides systems and methods for data analysis of experimental data. The analysis can include reference data that are not directly generated from the present experiment, which reference data may be values of the experimental parameters that were either provided by a user, computed by the system with input from a user, or computed by the system without using any input from a user. Another example of such reference data may be information about the instrument, such as the calibration method of the instrument.