The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Sep. 02, 2021
Applicant:

Boe Technology Group Co., Ltd., Beijing, CN;

Inventors:

Youxue Wang, Beijing, CN;

Xiaohui Ma, Beijing, CN;

Kai Geng, Beijing, CN;

Mengjun Hou, Beijing, CN;

Qian Ha, Beijing, CN;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06T 19/20 (2011.01); G06T 7/12 (2017.01); G06T 17/20 (2006.01);
U.S. Cl.
CPC ...
G06T 19/20 (2013.01); G06T 7/12 (2017.01); G06T 17/20 (2013.01); G06T 2219/2004 (2013.01);
Abstract

A three-dimensional scene constructing method, apparatus and system, and a storage medium. The three-dimensional scene constructing method includes: acquiring point cloud data of a key object and a background object in a target scene, wherein the point cloud data of the key object comprises three-dimensional information and corresponding feature information, and the point cloud data of the background object at least comprises three-dimensional information; establishing a feature database of the target scene, wherein the feature database at least comprises a key object feature library for recording three-dimensional information and feature information of the key object; performing registration and fusion on the point cloud data of the key object and the point cloud data of the background object, so as to obtain a three-dimensional model of the target scene; and when updating the three-dimensional model, reconstructing the three-dimensional model in a regional manner according to the feature database.


Find Patent Forward Citations

Loading…