The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Oct. 16, 2019
International Business Machines, Armonk, NY (US);
Dung Tien Phan, Ossining, NY (US);
Robert Jeffrey Baseman, Brewster, NY (US);
Fateh Ali Tipu, Wappingers Falls, NY (US);
Nam H. Nguyen, Pleasantville, NY (US);
Ramachandran Muralidhar, Mahopac, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method of improving at least one of quality and yield of a physical process comprises: obtaining values, from respective performances of the physical process, for a plurality of variables associated with the physical process; determining at least one Gaussian mixture model (GMM) representing the values for the variables for the performances of the physical process; based at least in part on the at least one GMM, computing at least one anomaly score for at least one of the variables for at least one of the performances of the physical process; based on the at least one anomaly score, identifying the at least one of the performances of the physical process as an outlier; and, based at least in part on the outlier identification, modifying the at least one of the variables for one or more subsequent performances of the physical process.