The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Jun. 28, 2023
Applicant:
Canon Kabushiki Kaisha, Tokyo, JP;
Inventor:
Daisuke Shibata, Ibaraki, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/12 (2006.01); G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06F 3/1234 (2013.01); G06F 3/1208 (2013.01); G06F 3/121 (2013.01); G06T 7/0004 (2013.01); G06T 2207/30144 (2013.01);
Abstract
On the basis of determination by image inspection that an image defect is generated and a predetermined condition being satisfied, an instruction unit for issuing an image diagnosis instruction is displayed on a screen of an inspection result, and image diagnosis is executed in response to an operation on the instruction unit.
Shibata, Daisuke. (2024). Inspection apparatus and control method of inspection apparatus (U.S. Patent No. 11954382). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11954382
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