The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Jan. 28, 2022
Dell Products L.p., Round Rock, TX (US);
Xiaojun Wu, Shanghai, CN;
Jing J. Chen, Newton, MA (US);
Muzhar S. Khokhar, Shrewsbury, MA (US);
Haijun Zhong, Shanghai, CN;
Dell Products L.P., Round Rock, TX (US);
Abstract
A testing method accesses tracing data comprising a plurality of tracing records corresponding to a plurality of test cases executed on a target system. The target system includes a plurality of microservices configured in accordance with a REST API. A dynamic test analyzer accesses the tracing data and imports a definition of the REST API. The analyzer checks each tracing record for consistency with the API definition. Based on this checking of the tracing records, one or more coverage metrics may be calculated. If any one or more of the one or more coverage metrics fails to exceed a threshold coverage, a testing action may be required. In some cases, the testing action may be selected from either seeking additional coverage of the APIs included in the target system or seeking additional test result coverage.