The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Feb. 25, 2020
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Yasuaki Abe, Takatsuki, JP;

Yuki Ueyama, Kyoto, JP;

Takahiro Toku, Kusatsu, JP;

Shuji Inamoto, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 13/04 (2006.01); G05B 19/05 (2006.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G05B 13/048 (2013.01); G05B 19/054 (2013.01); G06N 5/04 (2013.01); G05B 2219/1105 (2013.01);
Abstract

A prediction control development device according to one aspect of the present invention generates a prediction model of a control amount by analyzing first time-series data of the control amount and provides the generated prediction model to a controller. The prediction control development device acquires second time-series data showing transition of a value of the control amount during prediction control using the prediction model, and evaluates prediction accuracy of the prediction model based on a difference between a prediction value by the prediction model and a value of the second time-series data. When the prediction accuracy of the prediction model is not allowable, the prediction control development device analyzes the second time-series data to newly generate a prediction model of the control amount, and provides the newly generated prediction model to the controller.


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