The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Dec. 09, 2021
Applicant:

Ramona Optics Inc., Durham, NC (US);

Inventors:

Mark Harfouche, Durham, NC (US);

Gregor Horstmeyer, Durham, NC (US);

Robert Horstmeyer, Durham, NC (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/36 (2006.01); G02B 21/06 (2006.01); H04N 23/67 (2023.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G02B 21/06 (2013.01); G02B 21/368 (2013.01); H04N 23/67 (2023.01);
Abstract

An imaging system is configured with an autofocus operation that refocuses multiple cameras of the imaging system on detected features of interest, instead of on the whole image of the sample. Focus measures are calculated on the detected features, and then aggregated to focus distances of actuator moving the camera array, the sample stage, or individual cameras based on a maximization of detected features to be in focus. After the refocus, the imaging system recaptures new images and analyzes features on the new images to generate statistical characterization of the sample based on the classification of the features.


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