The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Jul. 06, 2022
Rohde & Schwarz Gmbh & Co. KG, Munich, DE;
Mert Celik, Munich, DE;
Adam Tankielun, Ottobrunn, DE;
ROHDE & SCHWARZ GMBH & CO. KG, Munich, DE;
Abstract
A measurement device and method for testing a device under test (DUT). The device includes an input terminal for receiving a RF signal from the DUT; at least one analog-to-digital (A/D) converter configured to generate a digital data including a plurality of sampled signals from the received RF signal; at least one filter configured to filter the digital data generated by the at least one A/D converter based on an intermediate-frequency bandwidth (IFBW) set in the at least one filter; a detector configured to analyse the filtered digital data based on a pre-set number of samples from the filtered digital data; and a controller configured to calculate a signal-to-noise ratio (SNR) value of the analysed filtered digital data, and to adjust at least one of the IFBW of the at least one filter and the number of samples of the detector based on the calculated SNR value.