The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Sep. 28, 2020
Sysmex Corporation, Kobe, JP;
Kouichi Masutani, Kobe, JP;
Yuji Wakamiya, Kobe, JP;
SYSMEX CORPORATION, Kobe, JP;
Abstract
A sample measurement system and method of transporting of racks are provided that collectively supply the consumables to the sample measurement units. The sample measurement system includes: sample measurement units that perform measurement on samples by using consumables; a setting part in which a user sets consumable racks housing the consumables; a first transport path that supplies the consumable racks set in the setting part to one of the sample measurement units; a collector that is arranged adjacent to the setting part and that collects empty racks that are emptied after being transported to at least one of the sample measurement units; and a second transport path that transports the empty racks to the collector.