The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Jul. 12, 2021
Applicant:
Fujifilm Corporation, Tokyo, JP;
Inventors:
Takeya Meguro, Kanagawa, JP;
Kazuhiro Hirota, Kanagawa, JP;
Yoshihiro Seto, Kanagawa, JP;
Kaku Irisawa, Kanagawa, JP;
Hirotaka Watano, Kanagawa, JP;
Taiji Iwasaki, Kanagawa, JP;
Tatsuyuki Denawa, Kanagawa, JP;
Haruyasu Nakatsugawa, Kanagawa, JP;
Assignee:
FUJIFILM CORPORATION, Tokyo, JP;
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G01N 33/49 (2006.01); G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00732 (2013.01); G01N 33/49 (2013.01); G06T 7/0012 (2013.01); G01N 2035/00831 (2013.01);
Abstract
A management system including at least one processor, wherein the processor is configured to acquire an image obtained by imaging a sample container containing a sample, recognize relevant information related to reliability of a test result related to the sample based on the image, and derive reliability information indicating the reliability of the test result related to the sample based on the recognized relevant information.