The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Oct. 09, 2019
Applicant:

Hitachi High-tech Corporation, Tokyo, JP;

Inventors:

Sunao Funakoshi, Tokyo, JP;

Takenori Okusa, Tokyo, JP;

Nobuyuki Isoshima, Tokyo, JP;

Koki Yokoyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); B01L 3/00 (2006.01); B01L 7/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00663 (2013.01); B01L 3/52 (2013.01); B01L 3/56 (2013.01); B01L 7/00 (2013.01); B01L 2200/16 (2013.01); B01L 2300/0663 (2013.01); B01L 2300/18 (2013.01); G01N 2035/00425 (2013.01); G01N 2035/00673 (2013.01);
Abstract

An automatic analysis device includes a processing unitwhich performs the treatment on a specimen before analysis of the specimen, supply equipment which supplies a reagent to a reaction vesseldisposed in the processing unit, a liquid temperature adjusting unitwhich adjusts a temperature of the reagent supplied to the reaction vesselby the supply equipment, a control unit, and a first temperature detection unitwhich detects at least one temperature of a temperature of the air within the processing unitand a temperature of the reagent supplied to the reaction vessel, in which the liquid temperature adjusting unitand the control unitexecute temperature adjustment of the reagent based on a first temperature detected by the first temperature detection unit


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