The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Aug. 19, 2020
Applicant:

Hach Company, Loveland, CO (US);

Inventors:

Michael Jonathan Tschampl, Windsor, CO (US);

Peter Michalski, Broomfield, CO (US);

Reece W. Hopkins, Charleston, SC (US);

Frederik Nordahl, Glienicke, DE;

Assignee:

HACH COMPANY, Loveland, CO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 33/487 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
G01N 33/48771 (2013.01); B01L 3/545 (2013.01); B01L 2200/16 (2013.01);
Abstract

The invention provides a method for selecting a color for a chemistry or instrument based upon a parameter of a test, the method including: identifying a color corresponding to a parameter of a test for the parameter; selecting, if the color corresponding to the parameter has not previously been used for another parameter, the color for designating a chemistry or an instrument as corresponding to the parameter; selecting, if the color corresponding to the parameter has previously been used for another parameter, a different color other than the color for designating a chemistry or an instrument as corresponding to the parameter, wherein the selecting a color other than the color comprises identifying a color having a measure of change in visual perception of the different color against other previously selected colors a predetermined value from the other previously selected colors; and utilizing the selected colors for parameters across both chemistries () and instruments () that are utilized in tests for the parameters.


Find Patent Forward Citations

Loading…