The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Aug. 20, 2019
Abb Schweiz Ag, Baden, CH;
Jinendra Gugaliya, Bangalore, IN;
Arun Kumar Gupta, Mumbai, IN;
ABB Schweiz AG, Baden, CH;
Abstract
The present application discloses method and sewer () for detecting faults associated with a gas chromatograph device () in a process plant. The gas chromatograph device () is associated with a database () configured to store a measured chromatogram, and historic chromatograms. Initially, the server receives the measured chromatogram from the database. Upon receiving the measured chromatogram, the server is configured to detect at least one real-time symptom for measured chromatogram. The real-time symptoms may be detected by comparing the historic chromatograms with predetermined configuration data to the measured chromatogram. Upon detecting the real-time symptoms, the server is configured to determine faults associated with the gas chromatograph device. The faults are determined by mapping the real-time symptoms and fault signature data received from the database. The fault signature data is generated using machine learning model trained by providing the faults and the historic gas chromatogram.