The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Aug. 03, 2016
Applicant:
Spectrasensors, Inc., Rancho Cucamonga, CA (US);
Inventors:
Alfred Feitisch, Los Gatos, CA (US);
Xiang Liu, Rancho Cucamonga, CA (US);
Kevin Ludlum, Los Gatos, CA (US);
Mathias Schrempel, Alta Loma, CA (US);
Assignee:
Endress+Hauser Optical Analysis, Inc., Ann Arbor, MI (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/27 (2006.01); G01J 3/02 (2006.01); G01J 3/28 (2006.01); G01J 3/42 (2006.01); G01J 3/457 (2006.01); G01N 21/39 (2006.01); G01N 21/21 (2006.01); G01N 21/35 (2014.01); G01N 21/3504 (2014.01); G01N 21/359 (2014.01);
U.S. Cl.
CPC ...
G01N 21/274 (2013.01); G01J 3/0297 (2013.01); G01J 3/28 (2013.01); G01J 3/42 (2013.01); G01J 3/457 (2013.01); G01N 21/39 (2013.01); G01J 2003/423 (2013.01); G01N 21/211 (2013.01); G01N 21/35 (2013.01); G01N 21/3504 (2013.01); G01N 21/359 (2013.01); G01N 2021/3595 (2013.01); G01N 2021/399 (2013.01);
Abstract
Frequency registration deviations occurring during a scan of a frequency or wavelength range by a spectroscopic analysis system can be corrected using passive and/or active approaches. A passive approach can include determining and applying mathematical conversions to a recorded field spectrum. An active approach can include modifying one or more operating parameters of the spectroscopic analysis system to reduce frequency registration deviation.