The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Apr. 20, 2022
Applicant:

Okuma Corporation, Niwa-Gun, JP;

Inventor:

Yuji Mizoguchi, Niwa-Gun, JP;

Assignee:

Okuma Corporation, Niwa-Gun, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/30 (2006.01); G01M 99/00 (2011.01);
U.S. Cl.
CPC ...
G01M 99/005 (2013.01);
Abstract

An accuracy diagnostic device includes a change amount detecting unit, a change amount recording unit, an accuracy change predictor, and an accuracy adjustment timing presenting unit. The change amount detecting unit detects a magnitude of a change in at least one of a state of a machine tool and a surrounding environment of the machine tool as a change amount. The change amount recording unit records the change amount. The accuracy change predictor predicts a future accuracy change of the machine tool using the change amount recorded in the change amount recording unit. The accuracy adjustment timing presenting unit presents a timing at which an accuracy adjustment is to be required for the machine tool based on the accuracy change predicted by the accuracy change predictor.


Find Patent Forward Citations

Mizoguchi, Yuji. (2024). Accuracy diagnostic device and accuracy diagnostic method for machine tool, and accuracy adjustment reservation system (U.S. Patent No. 11953406). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11953406

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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