The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Nov. 15, 2019
Sookmyung Women's University Industry—academic Cooperation Foundation, Seoul, KR;
Young Ju Jeong, Yongin-si, KR;
Hea In Jeong, Seoul, KR;
Abstract
A method and apparatus for measuring optical characteristics of an augmented reality device are disclosed. A method of measuring optical characteristics of an augmented reality device according to an exemplary embodiment of the present invention includes: taking a test image including a plurality of patterns that is output on a virtual plane by the augmented reality device, using at least one camera disposed around a predetermined measurement reference position; acquiring field of view information including information about the field of view of the at least one camera, and photographing system information including information about the arrangement of the at least one camera; and calculating the coordinates of a plurality of patterns with respect to the measurement reference position on the basis of a plurality of captured images taken by the at least one camera, field of view information, and photographing system information.