The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Feb. 21, 2020
Applicants:

Universite DE Paris, Paris, FR;

Sorbonne Universite, Paris, FR;

Ecole Polytechnique, Palaiseau, FR;

Centre National DE LA Recherche Scientifique, Paris, FR;

Commissariat a L'energie Atomique ET Aux Energies Alternatives, Paris, FR;

Inventors:

Marc Guillon, Versailles, FR;

Pascal Berto, Paris, FR;

Dimitris Papadopoulos, Antony, FR;

Gilles Tessier, Paris, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/00 (2006.01);
U.S. Cl.
CPC ...
G01J 9/00 (2013.01);
Abstract

A method for determining wavefront shapes of a multi-spectral signal light beam from a single signal image acquisition of said multi-spectral signal beam, with a device including an optical assembly made at least of an optical mask and an imaging sensor, notably a matrix imaging sensor, for generating and recording intensity patterns of incident beams, by having these beams reflect on, or propagate through, the optical mask. The optical mask having the optical properties: i) to cause the intensity pattern to depend on the wavefront shape, so that a tilt applied to the wavefront shape results in a displacement amount of the intensity pattern, and ii) to produce uncorrelated intensity patterns over at least one surface area A of the imaging sensor, for a plurality of respective incident monochrome beams of different wavelengths having a same wavefront shape.


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