The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Mar. 28, 2019
Nec Corporation, Tokyo, JP;
Shigeru Nakamura, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
An optical coherence tomographic imager for contributing reduction of the number of man-hours for evaluation to obtain a wavelength sweeping operation of continuous, linear, and monotonic change while utilizing a wavelength-tunable laser having a structure that is less susceptible to mechanical disturbance. The optical coherence tomographic imager includes a wavelength-tunable light source, a branching means, an irradiation means, a photoelectric conversion measuring means, and a processor. The wavelength-tunable light source outputs light whose wavelength is determined by a plurality of light source drive parameters. The branching means branches output light of the wavelength-tunable light source into object light and reference light. The irradiation means irradiates an object to be measured with the object light. The photoelectric conversion measuring means obtains interference light intensity measurement values by causing object light scattered from the object to be measured and the reference light to interfere with each other and to be guided to a light receiver. The processor reorders the interference light intensity measurement values based on the output light wavelengths.