The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
May. 04, 2021
Chengdu Pin Tai Ding Feng Business Administration, Sichuan, CN;
Qianwen Xiang, Sichuan, CN;
Wanjia Ao, Sichuan, CN;
Youmin Zhuang, Sichuan, CN;
Ruojia Wang, Sichuan, CN;
Zixin Xie, Sichuan, CN;
Mintong Wu, Sichuan, CN;
Ruihan Zhang, Sichuan, CN;
CHENGDU PIN TAI DING FENG BUSINESS ADMINISTRATION, Chengdu, CN;
Abstract
Provided is a three-dimensional measurement device, including an illumination system (I) and an imaging system (II). The illumination system includes, along an illumination light path, a light source (), a light beam shaping apparatus (), a pattern modulation apparatus (), and a projection lens (). The pattern modulation apparatus is configured to form a coded pattern. The light beam shaping apparatus is configured to shape light emitted by the light source into near-parallel light. The projection lens is configured to project the coded pattern onto a target object. The imaging system includes an imaging lens (), a first beam-splitting system (), and an image sensor group including N image sensors (). The first beam-splitting system is configured to transmit the coded pattern received by the imaging lens and projected onto the target object to the N image sensors of the image sensor group.