The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Jul. 25, 2019
Fundación Cener-ciemat, Sarriguren, ES;
Iñigo Les Aguerrea, Navarra, ES;
Amaia Mutuberria Larrayoz, Navarra, ES;
Adrian Peña Lapuente, Navarra, ES;
Marcelino Sanchez Gonzalez, Navarra, ES;
Carlos Heras Vila, Saragossa, ES;
Iñigo Salina Áriz, Saragossa, ES;
David Izquierdo Núñez, Saragossa, ES;
Javier Garcia-Barberena Labiano, Navarra, ES;
FUNDACIÓN CENER-CIEMAT, Sarriguren, ES;
Abstract
A characterization device, system, and method for characterizing reflective elements from the light beams reflected in it. The device has two variable-gain detectors on a common structure, which can be portable or fixed, and for capturing light beams reflected by a reflective element, and from at least one processor characterizing the quality of the reflected light beams and evaluating the quality of the reflective element from its reflective capacity. Each detector has a lens for increasing the signal-to-noise ratio of the reflected beam or beams, a light sensor on which the beam or beams captured by the lens are focused, an automatic gain selection system associated with the optical sensor, and a data communication device associated with the device itself. A characterization system and a characterization method for characterizing reflective elements from the quality of the light beams reflected in at least one reflective element or heliostat.