The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 09, 2024

Filed:

Nov. 13, 2020
Applicant:

General Electric Company, Schenectady, NY (US);

Inventors:

Ponnada V S S Srivatsa, Bangalore, IN;

Venkata Rachakonda, Bangalore, IN;

Mattias Fager, Onsala, SE;

Paer Christoffer Arumskog, Gothenburg, SE;

Megha Navalgund, Bangalore, IN;

Sharan Arumugam, Bangalore, IN;

Aman Tiwari, Dewas, IN;

Anders Ingvarsson, Mölnlycke, SE;

Fredrik Tommy Mohlin, Västra Frölunda, SE;

Simon Blomé, Gothenburg, SE;

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 99/00 (2011.01); B23K 26/342 (2014.01); B23K 31/00 (2006.01); B23K 31/12 (2006.01); B33Y 50/02 (2015.01); G08B 21/18 (2006.01);
U.S. Cl.
CPC ...
B23K 26/342 (2015.10); B23K 31/003 (2013.01); B23K 31/125 (2013.01); B33Y 50/02 (2014.12); G01M 99/005 (2013.01); G08B 21/187 (2013.01);
Abstract

A system for diagnosing an additive manufacturing device is provided. The system includes one or more processors, one or more non-transitory memory modules communicatively coupled to the one or more processors and storing machine-readable instructions. The machine-readable instructions, when executed, cause the one or more processors to: determine parameters associated with at least one subsystem of the additive manufacturing device, the parameters being related to a build generated by the additive manufacturing device; compare the parameters with threshold values; and determine a failure mode, among a plurality of failure modes, associated with a subsystem of the at least one subsystem of the additive manufacturing device based on the comparison of the parameters with the threshold values.


Find Patent Forward Citations

Srivatsa, Ponnada V S S. (2024). Systems, and methods for diagnosing an additive manufacturing device (U.S. Patent No. 11951567). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11951567

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…