The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 09, 2024
Filed:
Nov. 06, 2019
Trumpf Laser-und Systemtechnik Gmbh, Ditzingen, DE;
Trumpf Laser Gmbh, Schramberg, DE;
Martin Stambke, Dunningen, DE;
Jan-Patrick Hermani, Markgroeningen, DE;
Thomas Notheis, Schramberg, DE;
Alexander Sauter, Balingen, DE;
TRUMPF Laser- und Systemtechnik Gm H, Ditzingen, DE;
TRUMPF Laser GmbH, Schramberg, DE;
Abstract
A method determines translational and/or rotational deviations between the measurement coordinate system of a measurement mirror scanner and the processing coordinate system of a processing mirror scanner. A measurement beam reflected at a workpiece returns on a path of an incident measurement beam and is captured by a spatially resolving measurement sensor to ascertain spatially resolving information of the workpiece. The reflected measurement beam, in a sensor image of the measurement sensor, is imaged onto a previously known image position. This is accomplished by ascertaining a focal position deviation of the processing beam by scanning with the processing beam, evaluating a laser power detected at grid points, fixing the processing mirror scanner, capturing spatially resolving height information of the pinhole diaphragm by the measurement sensor, and determining a translational deviation between the processing and measurement coordinate systems based on the deviation.