The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

May. 31, 2022
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Yunjae Suh, Suwon-si, KR;

Jongwoo Bong, Seoul, KR;

Seungnam Choi, Seoul, KR;

Junseok Kim, Hwaseong-si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 25/47 (2023.01); G06T 7/20 (2017.01); H04N 23/71 (2023.01); H04N 25/40 (2023.01); H04N 25/75 (2023.01); H04N 25/76 (2023.01);
U.S. Cl.
CPC ...
H04N 25/47 (2023.01); G06T 7/20 (2013.01); H04N 23/71 (2023.01); H04N 25/40 (2023.01); H04N 25/75 (2023.01); H04N 25/76 (2023.01);
Abstract

Provided are a vision sensor, an image processing device including the vision sensor, and an operating method of the vision sensor. The vision sensor includes a plurality of pixels arranged in a matrix form, wherein each of the plurality of pixels includes: a sensing circuit configured to output an output voltage by sensing a change of light; a comparison circuit configured to output a comparison signal indicating whether an event has occurred by comparing the output voltage to an event threshold; and an event detection circuit configured to generate internal event signals by sampling the comparison signal at each of a plurality of sampling time points, and configured to output a valid event signal based on the internal event signals.


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