The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Jul. 30, 2021
Applicant:

Sony Group Corporation, Tokyo, JP;

Inventors:

Karl James Sharman, Basingstoke, GB;

Stephen Mark Keating, Basingstoke, GB;

Magali Kimlee Miri Philippe, Basingstoke, GB;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 19/159 (2014.01); H04N 19/105 (2014.01); H04N 19/11 (2014.01); H04N 19/167 (2014.01); H04N 19/176 (2014.01); H04N 19/44 (2014.01); H04N 19/513 (2014.01); H04N 19/593 (2014.01); H04N 19/60 (2014.01);
U.S. Cl.
CPC ...
H04N 19/159 (2014.11); H04N 19/105 (2014.11); H04N 19/11 (2014.11); H04N 19/167 (2014.11); H04N 19/176 (2014.11); H04N 19/45 (2014.11); H04N 19/513 (2014.11); H04N 19/593 (2014.11); H04N 19/60 (2014.11);
Abstract

An image encoding apparatus comprises a selector configured to select, from a set of candidate prediction operations each defining at least a prediction direction, a prediction operation for prediction of samples of a current region of a current image, the current region comprising an array of two or more rows and two or more columns of samples; an intra-image predictor configured to derive predicted samples of the current region with respect to one or more of a group of reference samples of the same image in dependence upon a prediction direction, defined by the selected prediction operation, between a current sample to be predicted and a reference position amongst the reference samples; in which, for at least some of the candidate prediction operations, the group of reference samples comprises two or more parallel linear arrays of reference samples disposed at different respective separations from the current region; a detector configured to detect whether samples corresponding to any of the two or more parallel linear arrays of reference samples are unavailable for use in prediction of samples of the current region and, if any of the two or more parallel linear arrays of reference samples are unavailable, to inhibit selection, by the selector, of a candidate prediction operation dependent upon the unavailable reference samples.


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