The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Dec. 02, 2022
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Tomoya Teraji, Tokyo, JP;

Katsutoshi Miyahara, Kanagawa, JP;

Takehiko Kasamatsu, Kanagawa, JP;

Shota Nonaka, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 1/193 (2006.01); G06V 10/10 (2022.01); H04N 1/387 (2006.01);
U.S. Cl.
CPC ...
H04N 1/193 (2013.01); G06V 10/16 (2022.01); H04N 1/3876 (2013.01);
Abstract

An image reading device includes linear image sensors that are arranged so that adjacent image sensors include an overlapping region in which portions of reading regions of the adjacent image sensors overlap in a main scanning direction, and a buffer unit for read image data. Image data of each overlapping region are generated by synthesizing first image data obtained by a first linear image sensor and second image data obtained by a second linear sensor, the first linear image sensor and the second linear sensor being adjacent in the main scanning direction. Image data of the predetermined line is generated based on image data in which the image data of each overlapping region are excluded from the image data stored in the buffer unit and the image data of each overlapping region. The processing is repeatedly executed in a sub-scanning direction.


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