The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Oct. 19, 2022
Applicant:

Bitdrift, Inc., San Francisco, CA (US);

Inventors:

Kirti Agarwal, Wood Ridge, CA (US);

Behrooz Badii, Westport, CT (US);

Nathaniel Joseph Oorloff, Brooklyn, NY (US);

Jeffrey Tsvi Pinner, Tiburon, CA (US);

Yann Thomas Ramin, Folsom, CA (US);

Assignee:

Bitdrift, Inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01); H04L 69/04 (2022.01); H04L 47/38 (2022.01); H04L 51/06 (2022.01);
U.S. Cl.
CPC ...
H04L 69/04 (2013.01); H04L 47/38 (2013.01); H04L 51/06 (2013.01);
Abstract

The present disclosure relates to systems, methods, and non-transitory computer-readable media that generate compressed metric data for digital metrics utilizing a graph-based compression dictionary and time slice compression. For instance, the disclosed systems can utilize a dynamically modifiable graph-based compression dictionary to generate compressed metric label identifiers for metric labels of digital metrics. The graph-based compression dictionary can include nodes and edges corresponding to metric label segments and metric label identifier values, respectively. The disclosed systems can traverse the graph-based compression dictionary using a metric label to determine the corresponding compressed metric label identifier. The disclosed systems can further generate delta compression values for the metric values of the digital metrics. For instance, the disclosed systems can compare metric values within a single time slice (e.g., a time stamp) to generate corresponding delta compression values. In some cases, the disclosed systems further compare the metric values across a time window.


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