The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Mar. 28, 2019
Applicant:

Siemens Aktiengesellschaft, Munich, DE;

Inventors:

Kristian Mo, Trondheim, NO;

Vegard Kleppe Torkelsen, Oslo, NO;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 67/125 (2022.01); H04W 4/38 (2018.01); H04W 52/02 (2009.01);
U.S. Cl.
CPC ...
H04L 67/125 (2013.01); H04W 4/38 (2018.02); H04W 52/0251 (2013.01);
Abstract

A method of condition monitoring for a device, the method including determining a desired state of the device, or event, at which sensor data is to be obtained; determining an indicator indicating the desired state or event; monitoring for the indicator; sending an instruction to one or more sensors associated with the device to trigger activation of the sensor when the desired state or event has occurred, as indicated by the indicator; receiving data from the activated sensor; and returning the sensor to a sleep mode after the data has been received from the sensor.


Find Patent Forward Citations

Mo, Kristian. (2024). Condition monitoring system and method (U.S. Patent No. 11949742). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11949742

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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