The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Sep. 06, 2022
Applicant:

Keysight Technologies, Inc., Santa Rosa, CA (US);

Inventors:

Winston Wencheng Liu, Woodland Hills, CA (US);

Dan Mihailescu, Mogosoaia, RO;

Matthew R. Bergeron, Sunol, CA (US);

Assignee:

KEYSIGHT TECHNOLOGIES, INC., Santa Rosa, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01); H04L 41/14 (2022.01); H04L 67/10 (2022.01);
U.S. Cl.
CPC ...
H04L 41/14 (2013.01); H04L 67/10 (2013.01);
Abstract

Methods, systems, and computer readable media for testing a system under test (SUT). An example system includes a distributed processing node emulator configured for emulating a multi-processing node distributed computing system using a processing node communications model and generating intra-processing node communications and inter-processing node communications in the multi-processing node distributed computing system. At least a portion of the inter-processing node communications comprises one or more messages communicated with the SUT by way of a switching fabric. The system includes a test execution manager configured for managing the distributed processing node emulator to execute a pre-defined test case, monitoring the SUT, and outputting a test report based on monitoring the SUT during execution of the pre-defined test case.


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