The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Feb. 10, 2022
Applicant:

Denso Corporation, Kariya, JP;

Inventors:

Kouichi Nakamura, Kariya, JP;

Nobuyori Nakazima, Kariya, JP;

Assignee:

DENSO CORPORATION, Kariya, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 5/00 (2006.01); G01R 31/34 (2020.01); H02H 7/08 (2006.01); H02P 1/00 (2006.01); H02P 3/00 (2006.01); H02P 29/024 (2016.01); B62D 5/04 (2006.01);
U.S. Cl.
CPC ...
H02P 29/024 (2013.01); G01R 31/343 (2013.01); B62D 5/0487 (2013.01);
Abstract

A control device is configured to control an operation of a control target. The control device is configured to monitor an abnormality. The control device is configured to store abnormality information according to an abnormality monitor result. When the abnormality of a monitor target is detected, an abnormality treatment confirmation determination related to a transition determination to an abnormality treatment due to an occurrence of the abnormality is different from an abnormality storage confirmation determination that causes the control device to store, as the abnormality information, the abnormality of the monitor target.


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