The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Sep. 23, 2021
Boe Technology Group Co., Ltd., Beijing, CN;
Shaodong Sun, Beijing, CN;
Haoran Gao, Beijing, CN;
Guangcai Yuan, Beijing, CN;
Lilei Zhang, Beijing, CN;
Wenyue Fu, Beijing, CN;
Li Li, Beijing, CN;
Hanbo Zheng, Beijing, CN;
Shuqi Liu, Beijing, CN;
Qi Qi, Beijing, CN;
Junwei Yan, Beijing, CN;
Pingkuan Gu, Beijing, CN;
Lina Jing, Beijing, CN;
Yan Chen, Beijing, CN;
Yimin Chen, Beijing, CN;
BOE Technology Group Co., Ltd., Beijing, CN;
Abstract
The present disclosure relates to a device and a system for testing flatness. The device for testing flatness includes a base, a testing platform, and a ranging sensor. The testing platform is assembled on the base. The testing platform includes a supporting structure. The supporting structure is disposed on the side of the testing platform away from the base and is used to support a to-be-tested board. The structure matches the structure of the to-be-tested board. The ranging sensor is disposed on the side of the testing platform away from the base. After the to-be-tested board is placed on the testing platform, the ranging sensor is used to test distances between a number N of to-be-tested positions on the to-be-tested board and the ranging sensor, to obtain N pieces of distance information, and the N pieces of distance information are used to determine the flatness of the to-be-tested board, where N is an integer greater than 2. According to the embodiments of the present disclosure, the flatness of the glass substrate can be tested to improve the manufacturing process to reduce the flatness of the glass substrate, and avoid the problem that the glass substrate is easily broken when entering the subsequent process equipment and the process equipment is down.