The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Jul. 13, 2018
Applicant:

Carrier Corporation, Palm Beach Gardens, FL (US);

Inventors:

Jie Xi, Shanghai, CN;

Michael J. Birnkrant, Wethersfield, CT (US);

Junyang Lin, Shanghai, CN;

Jun Hou, Shanghai, CN;

Peter R. Harris, West Hartford, CT (US);

Tianyuan Chen, Shanghai, CN;

Assignee:

CARRIER CORPORATION, Palm Beach Gardens, FL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B 17/10 (2006.01); G01N 15/06 (2006.01); G06F 18/2415 (2023.01); G06F 18/2451 (2023.01); G06F 18/2453 (2023.01); G06F 18/25 (2023.01); G08B 17/107 (2006.01);
U.S. Cl.
CPC ...
G08B 17/107 (2013.01); G01N 15/06 (2013.01); G06F 18/24155 (2023.01); G06F 18/2451 (2023.01); G06F 18/2453 (2023.01); G06F 18/253 (2023.01); G06F 18/254 (2023.01); G01N 2015/0693 (2013.01);
Abstract

A method of measuring one or more conditions within a predetermined area includes receiving at a control system a signal including scattered light and time of flight information associated with a plurality of nodes of a detection system, parsing the time of flight information into zones of the detection system, identifying one or more features within the scattered light signal, and analyzing the one or more features within the scattered light signal to determine a presence of the one or more conditions within the predetermined area.


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