The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Jan. 31, 2021
Carl Zeiss Industrielle Messtechnik Gmbh, Oberkochen, DE;
Wolfgang Hoegele, Rosenheim, DE;
Carl Zeiss Industrielle Messtechnik GmbH, Oberkochen, DE;
Abstract
A position of an object is determined by optically capturing at least one capture structure arranged at the object or at a reference object captured from the object and thereby obtaining capture information, the at least one capture structure having a point-symmetrical profile of an optical property that varies along a surface of the capture structure, transforming a location-dependent mathematical function corresponding to the point-symmetrical profile of the optical property into a frequency domain, forming a second frequency-dependent mathematical function from a first frequency-dependent mathematical function, wherein the second mathematical function is formed from a relationship of in each case a real part and an imaginary part of complex function values of the first frequency-dependent mathematical function, and forming at least one function value of the second frequency-dependent mathematical function and determining the same as location information about a location of a point of symmetry of the location-dependent mathematical function.