The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Jul. 01, 2020
Makinarocks Co., Ltd., Seoul, KR;
Andre S. Yoon, Seoul, KR;
Sangwoo Shim, Sokcho-si, KR;
Yongsub Lim, Gunpo-si, KR;
Ki Hyun Kim, Yongin-si, KR;
Byungchan Kim, Seoul, KR;
JeongWoo Choi, Seoul, KR;
Jongsun Shinn, Seoul, KR;
MakinaRocks Co., Ltd., Seoul, KR;
Abstract
Disclosed is a non-transitory computer readable medium storing a computer program, in which when the computer program is executed by one or more processors of a computing device, the computer program performs operations to provide methods for detecting flaws, and the operations may include: extracting a flaw patch from a flaw image including a flaw; preprocessing at least one of the flaw image or non-flaw image not including a flaw; extracting a non-flaw patch from at least one of the preprocessed flaw image or non-flaw image; and training a neural network model for classifying patches to flaw or non-flaw with a training data set including the flaw patch and the non-flaw patch.