The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Oct. 02, 2019
Applicant:
Siemens Medical Solutions Usa, Inc., Malvern, PA (US);
Inventors:
Alexander Hans Vija, Evanston, IL (US);
Francesc dAssis Massanes Basi, Chicago, IL (US);
Amos Yahill, Stony Brook, NY (US);
Ronald E. Malmin, Chicago, IL (US);
Assignee:
Siemens Medical Solutions USA, Inc., Malvern, PA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/30 (2006.01); A61B 6/03 (2006.01); G01M 11/02 (2006.01); G01M 11/08 (2006.01); G06T 7/00 (2017.01); G21K 1/02 (2006.01); A61B 6/58 (2024.01);
U.S. Cl.
CPC ...
G06T 7/0006 (2013.01); G01M 11/0207 (2013.01); G01M 11/081 (2013.01); G02B 27/30 (2013.01); G21K 1/02 (2013.01); A61B 6/037 (2013.01); A61B 6/583 (2013.01); G06T 2207/30164 (2013.01);
Abstract
A framework for characterization of a collimator. In accordance with one aspect, first and second sides of the collimator are photographed to generate first and second image data. An optical characterization map (OCM) may be generated based on the first and second image data, wherein the optical characterization map characterizes the individual channels of the collimator. Quality assessment or image reconstruction may then be performed based on the OCM.