The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Feb. 17, 2022
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Hassan Mansour, Boston, MA (US);
Yanting Ma, Allston, MA (US);
Petros Boufounos, Winchester, MA (US);
Mitsubishi Electric Research Laboratories, Inc., Cambridge, MA (US);
Abstract
Embodiment of the present disclosure disclose a tomographic imaging system for reconstructing an image of an internal structure of an object. An incident wavefield is transmitted into the object occupying a background domain embedding the object. The incident wavefield is scattered into multiple scattered wavefield by the object. The incident and scattered wavefields are measured as a total wavefield. The total wavefield propagates through a computational domain and a residual domain in the background domain that are defined by cross-domain and residual measurement operators. The total wavefield is used for the image reconstruction. The image is reconstructed by solving an optimization problem corresponding to the computational domain. The optimization problem is solved iteratively to minimize a difference between the total wavefield and a wavefield synthesized using a measurement operator and a Green's function operator from the reconstructed image. The reconstructed image is outputted via an output interface.