The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Jun. 02, 2020
Applicant:

Target Brands, Inc., Minneapolis, MN (US);

Inventors:

Moritz Drexl, San Francisco, CA (US);

Tikhon Jelvis, Sunnyvale, CA (US);

Cory Morris, Minneapolis, MN (US);

Michael Staab, Minneapolis, MN (US);

Assignee:

Target Brands, Inc., Minneapolis, MN (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06Q 30/0202 (2023.01); G06F 3/0482 (2013.01); G06Q 10/0631 (2023.01); G06Q 10/087 (2023.01);
U.S. Cl.
CPC ...
G06Q 30/0202 (2013.01); G06F 3/0482 (2013.01); G06Q 10/06315 (2013.01); G06Q 10/087 (2013.01);
Abstract

An interactive visualization tool for displaying metrics associated with inventory related output from a replenishment simulation for an enterprise supply chain is described. Predicted values for metrics associated with simulation output may be received on a per item, per node, per epoch basis for a plurality of items associated with the supply chain at a plurality of nodes of the supply chain over a plurality of epochs. A visualization tool user interface may be rendered that includes item and node menus enabling user selection of varying granularity levels for viewing the metrics. The metrics may be aggregated according to a presently selected level of granularity, and represented within a single graphical view of the user interface to visualize projected inventory positions of items across nodes of the supply chain. The aggregated metrics may include an expected projection and a worst-case projection for one or more types of the metrics.


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