The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Aug. 12, 2022
Oracle International Corporation, Redwood City, CA (US);
Jean-Baptiste Frederic George Tristan, Burlington, MA (US);
Michael Louis Wick, Burlington, MA (US);
Swetasudha Panda, Burlington, MA (US);
Oracle International Corporation, Redwood City, CA (US);
Abstract
A Bayesian test of demographic parity for learning to rank may be applied to determine ranking modifications. A fairness control system receiving a ranking of items may apply Bayes factors to determine a likelihood of bias for the ranking. These Bayes factors may include a factor for determining bias in each item and a factor for determining bias in the ranking of the items. An indicator of bias may be generated using the applied Bayes factors and the fairness control system may modify the ranking if the determines likelihood of bias satisfies modification criteria for the ranking.