logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11948024 B1

PDFFull Text
Date of Patent:
Apr. 02, 2024

Filed:

Nov. 18, 2021

Automated dynamic payload testing of odata apis

Applicant:

Sap SE, Walldorf, DE;

Inventors:

Krishnan Harihara Subramanian, Bangalore, IN;

Dinesh Bhandarkar, Bangalore, IN;

Jerin James, Kottayam, IN;

Madhu Tirumalasetti, Bangalore, IN;

Assignee:

SAP SE, Walldorf, DE;

Attorney:

Klarquist Sparkman, LLP

Primary Examiner:

Kevin L Young

Assistant Examiner:

Abdou K Seye

Int. Cl.
CPC ...
G06F 7/06 (2006.01); G06F 9/54 (2006.01); G06F 16/22 (2019.01); H04L 67/02 (2022.01);
U.S. Cl.
CPC ...
G06F 9/547 (2013.01); G06F 16/2282 (2019.01); H04L 67/02 (2013.01);
Abstract

Technologies are described for automated payload testing of open data protocol (OData) application programming interfaces (APIs). For example, metadata describing an OData service can be retrieved from the OData service. The OData service can then be tested for one or more entities of the OData service. Testing can be performed by dynamically creating various payloads for testing the entities of the OData service and the OData operations supported by the entities. Results of executing the payloads can be received and evaluated to determine whether a given payload was executed successfully by the OData service. Results of the testing (e.g., indications of success or failure) can be output.

Find Patent Forward Citations

Subramanian, Krishnan. (2024). Automated dynamic payload testing of odata apis (U.S. Patent No. 11948024). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11948024

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…