The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Nov. 28, 2022
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventors:

Takeshi Yoshida, Kyoto, JP;

Atsushi Matsudaira, Kyoto, JP;

Okiyuki Kunihiro, Kyoto, JP;

Maki Fukui, Kyoto, JP;

Yasuo Kakude, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2019.01); G06F 40/226 (2020.01); G06F 40/40 (2020.01); G06Q 30/018 (2023.01);
U.S. Cl.
CPC ...
G06F 40/40 (2020.01); G06F 40/226 (2020.01); G06Q 30/018 (2013.01);
Abstract

A validation document while responding to a customer's demand is efficiently created. A server creates a first sample document upon receiving, from a terminal device, a request for creation of the first sample document including an inspection item targeted for a first device. The terminal device receives an operation of inputting the parameter value to the first sample document, and transmits the inputted parameter value to the server. The server creates a first validation document on the basis of the parameter value received from the terminal device and on the basis of the first sample document.


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