The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Nov. 30, 2020
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Hui Kang, Briarcliff Manor, NY (US);

Yu Deng, Yorktown Heights, NY (US);

Xinyu Que, Yorktown Heights, NY (US);

Sinem Guven Kaya, New York, NY (US);

Bruce D'Amora, New Milford, CT (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01); G06F 11/07 (2006.01); G06F 11/34 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3466 (2013.01); G06F 11/0751 (2013.01);
Abstract

Techniques facilitating anomaly detection and root cause analysis using distributed trace data. In one example, a system can comprise a processor that executes computer executable components stored in memory. The computer executable components comprise: a preprocessing component; and a monitor component. The preprocessing component can generate a trace frame comprising a vectorized representation of textual trace data produced by microservices of a microservice application. The monitor component can identify a state of the microservice application using the trace frame.


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