The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Jan. 12, 2021
Applicant:

Memorence Ai Co., Ltd., Taipei, TW;

Inventor:

Pai-Heng Hsiao, Taipei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06F 18/214 (2023.01); G06F 18/24 (2023.01); G06V 10/764 (2022.01); G06V 10/778 (2022.01); G06V 10/82 (2022.01); G06V 20/52 (2022.01);
U.S. Cl.
CPC ...
G05B 19/41875 (2013.01); G05B 19/4183 (2013.01); G05B 19/41865 (2013.01); G06F 18/2155 (2023.01); G06F 18/24 (2023.01); G06V 10/764 (2022.01); G06V 10/7784 (2022.01); G06V 10/82 (2022.01); G06V 20/52 (2022.01);
Abstract

System and method for intelligently monitoring the production line that can monitor an inspected object image captured by an image capturing device, thereby allowing an operating station host to provide a labeling module to reinspect a classification decision of a classifier subsystem, to achieve the purpose of verifying the classification decision or checking whether there are missed inspections. In addition, the classifier subsystem can automatically filter out classification decisions with lower reliability to effectively reduce the number of reinspection. Moreover, a group of inspected object images can be analyzed first to obtain image difference features through comparison, which is suitable for insufficient training samples. Furthermore, the labeling module can simultaneously reinspect highly relevant historical classification decisions. Meanwhile, a second image capturing device is provided, so that the system can automatically label defect positions based on the inspected object image before and after repair, thereby learning to judge whether defects occur.


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