The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Jun. 05, 2020
Applicant:

Sumitomo Electric Industries, Ltd., Osaka, JP;

Inventors:

Katsushi Hamakubo, Osaka, JP;

Kazuyuki Sohma, Osaka, JP;

Kazuya Tokuda, Osaka, JP;

Tatsuya Konishi, Osaka, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/02 (2006.01); C03C 25/1065 (2018.01); C03C 25/326 (2018.01); C03C 25/47 (2018.01); C03C 25/6226 (2018.01); C08F 290/06 (2006.01); C08K 3/36 (2006.01); C09D 175/14 (2006.01);
U.S. Cl.
CPC ...
G02B 6/02395 (2013.01); C03C 25/1065 (2013.01); C03C 25/326 (2013.01); C03C 25/47 (2018.01); C03C 25/6226 (2013.01); C08F 290/067 (2013.01); C08K 3/36 (2013.01); C09D 175/14 (2013.01);
Abstract

A resin composition comprises: a base resin containing an oligomer, a monomer, and a photopolymerization initiator; and inorganic oxide particles, wherein the inorganic oxide particles are lump-shaped aggregated particles, and the volume average particle size of the inorganic oxide particles measured by an X-ray small angle scattering method is 5 nm or more and 800 nm or less.


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