The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Dec. 15, 2020
Applicant:

Exxonmobil Technology and Engineering Company, Spring, TX (US);

Inventor:

Jonathan Liu, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V 1/28 (2006.01); E21B 47/002 (2012.01); E21B 49/00 (2006.01); G01V 1/18 (2006.01); G01V 1/30 (2006.01); G01V 1/34 (2006.01); G01V 1/36 (2006.01); G01V 20/00 (2024.01); G06N 20/00 (2019.01);
U.S. Cl.
CPC ...
G01V 1/282 (2013.01); E21B 47/0025 (2020.05); E21B 49/00 (2013.01); G01V 1/181 (2013.01); G01V 1/301 (2013.01); G01V 1/305 (2013.01); G01V 1/345 (2013.01); G01V 1/368 (2013.01); G01V 20/00 (2024.01); E21B 2200/20 (2020.05); G01V 2210/66 (2013.01); G06N 20/00 (2019.01);
Abstract

Velocity tomography using time lags of wave equation migration is disclosed. Seismic tomography is a technique for imaging the subsurface of the Earth with seismic waves by generated a migration velocity model from a multitude of observations using combinations of source and receiver locations. The migration velocity model may be updated in order to reduce depth differences of reflection events (also called residual depth errors (RDE)). Direct measurement of RDE may be difficult in certain complex subsurface areas. In such areas, the RDE may be reconstructed based on time lags of wave equation migration and then used to update the migration velocity model. In particular, the RDE may be directly reconstructed from the time lags of wave equation migration, such as based on a direct relation between RDE and the time lags.


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