The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Feb. 04, 2019
Applicant:

Phc Holdings Corporation, Tokyo, JP;

Inventors:

Hiroshi Saiki, Ehime, JP;

Yoshimitsu Momoi, Ehime, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 35/00 (2006.01); G01N 35/10 (2006.01);
U.S. Cl.
CPC ...
G01N 35/00029 (2013.01); G01N 35/00584 (2013.01); G01N 35/1002 (2013.01); G01N 2035/00495 (2013.01);
Abstract

A sample analysis substrate in which transfer of a liquid is effected through rotational motions, including: a substrate having a rotation axis; a first retention chamber being located in the substrate and retaining a diluent; a measurement chamber being located in the substrate; at least one reagent; a reagent chamber being located in the substrate and having the at least one reagent disposed therein, the reagent chamber being connected to the measurement chamber; and a first diluent path being located in the substrate, and connecting the first retention chamber and the measurement chamber or reagent chamber.


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