The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Sep. 24, 2023
Applicants:

Beijing Precision Machinery & Engineering Research Co., Ltd., Beijing, CN;

Beijing University of Technology, Beijing, CN;

Inventors:

Yuhong Dai, Beijing, CN;

Nana Niu, Beijing, CN;

Zuguang Huang, Beijing, CN;

Junyan Xing, Beijing, CN;

Xiaofeng Zhu, Beijing, CN;

Huiling Ren, Beijing, CN;

Heqiang Liu, Beijing, CN;

Dequan Wang, Beijing, CN;

Yaru Hou, Beijing, CN;

Xiaoqin Hao, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 29/44 (2006.01);
U.S. Cl.
CPC ...
G01N 29/44 (2013.01);
Abstract

The present invention discloses a method for constructing a surface stress distribution cloud map based on critical refraction longitudinal wave detection. The method comprises: firstly, meshing a surface of a detected article; secondly, The mean transverse stress on different grid lines and the mean longitudinal stress on different grid lines were obtained by the critical refraction longitudinal wave detection method; next, calculating the equivalent stress of each mesh node according to the mean transverse stress on different mesh transverse lines and the mean longitudinal stress on different mesh longitudinal lines on the surface of the detected article; and finally, drawing a stress distribution cloud map of the surface of the detected article according to the equivalent stress. The present invention can obtain the stress situations at different points on the surface of the detected article.


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