The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Mar. 04, 2022
Damaged region determination system, determination apparatus and damaged region determination method
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiki Takayasu, Kawasaki, JP;
Takashi Usui, Saitama, JP;
Kazuo Watabe, Yokohama, JP;
Atsuro Oonishi, Kawasaki, JP;
Hiroshi Takahashi, Yokohama, JP;
Takamitsu Sunaoshi, Yokohama, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
According to one embodiment, a damaged region determination system of the embodiment includes a plurality of sensors, a position locator, and a determiner. The plurality of sensors detects elastic waves generated in a target object related to a railway which is a determination target of a damaged region. The position locator locates positions of sources of a plurality of elastic waves based on the plurality of elastic waves detected by each of the plurality of sensors. The determiner determines the damaged region in the target object based on the positions of the sources of the plurality of elastic waves.