The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 02, 2024
Filed:
Jul. 21, 2021
Applicant:
Fameccanica.data S.p.a., San Giovanni Teatino, IT;
Inventors:
Anselmo Cicchitti, San Giovanni Teatino, IT;
Enrico Iavazzo, San Giovanni Teatino, IT;
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/31 (2006.01); G01N 21/25 (2006.01); G01N 21/359 (2014.01); G01N 21/59 (2006.01); A61F 13/15 (2006.01); A61F 13/53 (2006.01); G01N 21/84 (2006.01);
U.S. Cl.
CPC ...
G01N 21/314 (2013.01); G01N 21/25 (2013.01); G01N 21/359 (2013.01); G01N 21/59 (2013.01); A61F 2013/1578 (2013.01); A61F 2013/15821 (2013.01); A61F 2013/530481 (2013.01); G01N 2021/8444 (2013.01); G01N 2021/845 (2013.01); G01N 2021/8472 (2013.01);
Abstract
A method for in-line analysis of a composite product, wherein a hyperspectral sensor is used to acquire images of samples of target materials that are part of the composite product, in order to perform an in-line optical inspection at process speed.