The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2024

Filed:

Dec. 24, 2018
Applicants:

Imec Vzw, Leuven, BE;

Vrije Universiteit Brussel, Brussels, BE;

Inventors:

Bruno Cornelis, Brussels, BE;

David Blinder, Antwerp, BE;

Peter Schelkens, Willebroek, BE;

Bart Jansen, Mechelen, BE;

Assignees:

IMEC VZW, Leuven, BE;

Vrije Universiteit Brussel, Brussels, BE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/1434 (2024.01); G01N 15/01 (2024.01); G01N 15/10 (2006.01); G01N 15/14 (2006.01); G01N 15/1433 (2024.01); G01N 15/149 (2024.01); G03H 1/00 (2006.01); G03H 1/04 (2006.01);
U.S. Cl.
CPC ...
G01N 15/1434 (2013.01); G01N 15/1433 (2024.01); G01N 15/147 (2013.01); G03H 1/0005 (2013.01); G03H 1/0443 (2013.01); G01N 2015/016 (2024.01); G01N 2015/1006 (2013.01); G01N 2015/1454 (2013.01); G01N 15/149 (2024.01); G03H 2001/005 (2013.01); G03H 2001/0447 (2013.01); G03H 2001/045 (2013.01); G03H 2001/0452 (2013.01);
Abstract

A differentiation system for differentiating cells includes an input device configured to receive holographic image data of a microscopic particle in suspension, holographic image data processing logic for converting the holographic image data to the frequency domain by performing a Fourier transform of the holographic image data, and a recognizer configured to determine characterization features of the holographic image data of the microscopic particle in the frequency domain for characterization of the microscopic particle, the characterization features comprising rotationally invariant features.


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